TY  - BOOK
AU  - Pavlov, Andrej
AU  - Sachdev, Manoj
TI  - Cmos Sram Circuit Design And Parametric Test In Nano-Scaled Technologies: Process-Aware Sram Design And Test
SN  - 9788132202325
U1  - 621.397 
PY  - 2013///
CY  - New Delhi
PB  - Springer
KW  - Electronics & Communication
ER  -