000 00313nam a2200121Ia 4500
008 221221s9999 xx 000 0 und d
020 _a9789380501550
082 _a623.043
_bWAN/V
100 _aWang, Laung Terng
245 0 _aVlsi Test Principles And Architectures
260 _aNew Delhi
_bElsevier
942 _cBK
999 _c34287
_d34287